Designed for high-current and high-voltage test applications
Supports QFN, QFP, and SO packages (≥ 0.4 mm pitch)
Suitable for manual test, machine test, and burn-in test
High current capacity:
12 A continuous
Up to 150 A peak (1% duty cycle)
Low contact resistance: 30 mΩ
Robust reliability:
Pin life: 1M–1.5M cycles
Socket life: > 5M cycles
Wide operating temperature range: −55 °C to +150 °C
Optimized electrical performance:
Bandwidth > 2.5 GHz @ −1 dB
Inductance: 2.2 nH
Durable materials: Vespel SP-1, Plavis-N, MDS-100, PEEK ceramic
Cost-effective standard design with short design and production lead time

WLCSP Probe Head