Category

Specification

Application

5G & RF, High-Frequency, High-Speed Semiconductor Testing

Socket Structure

Total metal coaxial structure

Supported Test Modes

Manual Test, Machine Test, Burn-In Test

Impedance Matching

50 Ω

Frequency Performance

Up to 80 GHz

Data Rate Support

Up to 224 Gbps

Operating Temperature Range

−55 °C to +175 °C

Supported Package Types

WLCSP, BGA, LGA, QFN, QFP

Minimum Pitch

≥ 0.25 mm

Contact Resistance

~80 mΩ

Rated Current

3.5 A (continuous)

Inductance

~1.0 nH

Pin Life

300K – 800K cycles

Socket Lifetime

> 5 million cycles

Design Approach

Self-developed, cost-efficient design

Key Benefits

High signal integrity, stable contact, long service life