Wafer Level Test is an electrical test performed at silicon wafer level to ensure its functionality.

NHK SPRING's Wafer Level Probe Card has a unique ultra fine coil spring technology for fine pitch vertical probes. This ensures a long compliant (pin stroke) to resolve any probing planarity issues, minimize pad damage, and to provides a low stable contact resistance.

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NHK Web Link:     http://www.nhkspg.co.jp/eng/mc/index.html